Preparation of Pb(Zr, Ti)O3 thin films sputtered from a multi-element metallic target

Nguyen, Thanh Huy
Vu, Ngoc Hung
Nguyen, Phu Thuy
PZT thin films have been grown on Pt/Ti/Si02/Si substrates by the reactive RF-magnetron sputtering deposition method using a multi-element metallic target. The AB03 perovskite structure in the thin films sputtered at a substrate temperature of 250 °c was formed through various intermediate phases by annealing at 650 °c for 1 hour in the air or an oxygen gas ambience. The film compositions were estimated by Electron Probe Micro-Analyzer (EPMA). The surface morphology observed by Atomic Force Microscopy (AFM) showed a densely packed grain structure with no rosettes structure. The remanent polarization value of the thin film with a thickness of 500 nm was 1.37 nC/cm .
Chi tiết xin mời tham khảo tại http://repository.vnu.edu.vn/handle/VNU_123/57890 
Title: Preparation of Pb(Zr, Ti)O3 thin films sputtered from a multi-element metallic target
Authors: Nguyen, Thanh Huy
Vu, Ngoc Hung
Nguyen, Phu Thuy
Keywords: Pb(Zr, Ti)O3 thin films;multi-element metallic target
Issue Date: 2004
Publisher: H. : ĐHQGHN
Series/Report no.: Vol. 20;No. 1 (2004)
Description: p. 31-36
URI: http://repository.vnu.edu.vn/handle/VNU_123/57890
ISSN: 2588-1124
Appears in Collections:Mathematics and Physics

Nhận xét

Bài đăng phổ biến từ blog này

Using the Directional Analytic Signals of Magnetic Gradient Tensor to Determine Boundaries of Source

The Determinants of Capital Adequacy Ratio: The Case of the Vietnamese Banking System in the Period 2011-2015

Detection o f the location o f the hazard during and after the design o f combinational circuits